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Vulnerability record · CVE-2025-47318 · published 24 September 2025

CVE-2025-47318: Qualcomm apq8017 firmware vulnerability

Qualcomm · Apq8017 Firmware

Transient DOS while parsing the EPTM test control message to get the test pattern.

7.5 CVSS 3.1 High EPSS 0.21% · top 90.3% CWE-126 · CWE-126
7.5CVSS 3.1 base score
0.21%EPSS exploitation probability, 30 days
NoNot in CISA KEV
150Affected product versions listed by NVD
1References
17 Jun 2026Last modified by NVD

Description

Transient DOS while parsing the EPTM test control message to get the test pattern.

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H

Affected products

150 vulnerable configurations from NVD's CPE data, grouped by vendor and product.

References

LinkTags
https://docs.qualcomm.com/product/publicresources/securitybulletin/september-2025-bulletin.html Vendor Advisory

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Same products first, then exploited flaws of the same weakness class.

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Source: NIST National Vulnerability Database (record CVE-2025-47318), CISA KEV, FIRST EPSS (scores of 2026-09-26). This page is refreshed as NVD updates the record.