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Vulnerability record · CVE-2024-53017 · published 3 June 2025

CVE-2024-53017: Qualcomm sdm429w firmware vulnerability

Qualcomm · Sdm429w Firmware

Memory corruption while handling test pattern generator IOCTL command.

6.6 CVSS 3.1 Medium EPSS 0.09% · top 99.6% CWE-823 · CWE-823
6.6CVSS 3.1 base score
0.09%EPSS exploitation probability, 30 days
NoNot in CISA KEV
4Affected product versions listed by NVD
1References
17 Jun 2026Last modified by NVD

Description

Memory corruption while handling test pattern generator IOCTL command.

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

Affected products

4 vulnerable configurations from NVD's CPE data, grouped by vendor and product.

References

LinkTags
https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html Vendor Advisory

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Related vulnerabilities

Same products first, then exploited flaws of the same weakness class.

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Source: NIST National Vulnerability Database (record CVE-2024-53017), CISA KEV, FIRST EPSS (scores of 2026-10-05). This page is refreshed as NVD updates the record.