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Vulnerability record · CVE-2022-25696 · published 16 September 2022

CVE-2022-25696: Qualcomm apq8053 firmware toctou race condition vulnerability

Qualcomm · Apq8053 Firmware

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

7.0 CVSS 3.1 High EPSS 0.09% · top 99.6% CWE-367 · TOCTOU race condition
7.0CVSS 3.1 base score
0.09%EPSS exploitation probability, 30 days
NoNot in CISA KEV
92Affected product versions listed by NVD
2References
17 Jun 2026Last modified by NVD

Description

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

CVSS:3.1/AV:L/AC:H/PR:L/UI:N/S:U/C:H/I:H/A:H

Affected products

92 vulnerable configurations from NVD's CPE data, grouped by vendor and product.

References

LinkTags
https://www.qualcomm.com/company/product-security/bulletins/september-2022-bulletin Vendor Advisory
https://www.qualcomm.com/company/product-security/bulletins/september-2022-bulletin Vendor Advisory

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Same products first, then exploited flaws of the same weakness class.

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Source: NIST National Vulnerability Database (record CVE-2022-25696), CISA KEV, FIRST EPSS (scores of 2026-09-29). This page is refreshed as NVD updates the record.