Vulnerability record · CVE-2021-1934 · published 9 September 2021
CVE-2021-1934: Qualcomm apq8017 firmware double free vulnerability
Qualcomm · Apq8017 Firmware
Possible memory corruption due to improper check when application loader object is explicitly destructed while application is unloading in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT
Description
Possible memory corruption due to improper check when application loader object is explicitly destructed while application is unloading in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Affected products
97 vulnerable configurations from NVD's CPE data, grouped by vendor and product.
References
| Link | Tags |
|---|---|
| https://www.qualcomm.com/company/product-security/bulletins/september-2021-bulletin | Vendor Advisory |
| https://www.qualcomm.com/company/product-security/bulletins/september-2021-bulletin | Vendor Advisory |
Track CVE-2021-1934 inside VULONE
Watch it alongside the ransomware crews, C2 infrastructure and forum chatter that reference it, query it through the API and pull it into your SIEM over TAXII.
Related vulnerabilities
Same products first, then exploited flaws of the same weakness class.
Source: NIST National Vulnerability Database (record CVE-2021-1934), CISA KEV, FIRST EPSS (scores of 2026-10-11). This page is refreshed as NVD updates the record.